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| Harsh environments exist in every area of the world to varying degrees. From a practical point of view, there is no such area with a benign environment. Thus components will see some form of harsh environment depending on its location. Corrosion of critical parts or components of electronic devices can produce a wide range of consequences from intermittent electrical faults to complete function breakdown. Research at the SRI is exploring key environments that result in such intermittence and failure i.e. temperature, humidity, and environmental pollutants (H2S, Cl2, NO2 and SO2). Surface analytical techniques such as scanning electron microscopy, energy dispersive analysis x-ray, x-ray photon spectroscopy, focused ion beam and secondary ion mass spectroscopy are being used in fundamental investigation and failure analysis of electronic devices. |
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